Seminar paper
Entry Year2009
Paper type會議論文
Paper title (chapter)China RFID patent analysis
Name of conferenceProceedings of the ASME International Manufacturing Science and Engineering Conference 2009 (MSEC2009-84168)
Name of author (Chinese)Charles V. Trappey
Name of author (English)Charles V. Trappey
AuthorsTrappey, C.V., Taghaboni-Dutta, F., Wu, H.-Y., Trappey, A.J.C.
LocationWest Lafayette, Indiana, USA


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