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研討會論文
學年度2010
論文名稱(篇名)A patent quality analysis methodology for innovation management, Proceedings
會議名稱International Conference on Mass Customization and Personalization - Asia Pacific 2010 (MCP-AP2010)
作者中文名張力元
作者英文名Charles V. Trappey
全部作者Trappey, A.J.C., Trappey, C.V., Wu, C.-Y., Lin, Chi-Wei
會議地點Taipei, Taiwan

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